• OPAC
  • EDS

Patent Analysis Tools

1. WIPS Global Patent Search and Analysis Database
WIPS is a precision retrieval and comprehensive analysis patent database that:

Contains patent information from over 100 countries and regions worldwide

Provides 43 searchable fields and 24 analyzable fields

Supports multiple search methods including integrated search, step-by-step search, citation search, family search, and company search

Features unique single patent claim analysis and patent family analysis capabilities

Offers offline patent management analysis tool - Thinklear for deep processing of patent information

Helps users accurately identify technology hotspots and research gaps

Guides users to avoid patent risks and develop innovative ideas

Provides strong support for R&D and technology development

2. INNOGRAPHY Innovative Patent Search and Analysis Tool
INNOGRAPHY platform from O-Know Company is one of the most remarkable intellectual property tools in recent years. Its data includes:

Global patent information covering 70+ countries with family patents, legal status and original documents

Patent litigation data including all patent cases from PACER and other regions

Standardized patent assignee data from D&B and SEC filings

US trademark registration information

3. CiteSpace
Developed by Dr. Chaomei Chen from Drexel University's College of Information Science and Technology.
Can be used for statistical analysis of Derwent patent data.

4. RefViz
Classifies existing literature and displays it through intuitive visualization.
Easily organizes literature distribution based on keyword intersections.